The quantitative compositional analysis with atom-probe field ion microscope and an application to metallurgy.
نویسندگان
چکیده
منابع مشابه
Analysis at the Atomic Level: The Atom Probe Field-Ion Microscope
Figure 2. Angular distributions of inelastic scattering around the undiffracted beam and around a beam diffracted through an angle a. The shaded area represents the contribution from the diffracted beam to the intensity collected by an on-axis aperture of semi-angle A3. [6] Egerton, R. F., Electron Energy Loss Spectroscopy in the Electron Microscope, Plenum Press, New York (1986). [7] Steele, J...
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The effects of field-evaporation rate on the quantitative chemical analysis of materials by atom-probe field-ion microscopy are considered. Examples of erroneously high measured values of the Ti concentration in Mo-1.0 at.% Ti and Mo-1.0 at.% Ti-0.08 at.% Zr (TZM) alloys are presented and the cause is shown to have been due to a high field-evaporation rate. The basic arguments used to explain t...
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This new alternate approach to data processing for analyses that traditionally employed grid-based counting methods is necessary because it removes a user-imposed coordinate system that not only limits an analysis but also may introduce errors. We have modified the widely used "binomial" analysis for APT data by replacing grid-based counting with coordinate-independent nearest neighbour identif...
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ژورنال
عنوان ژورنال: Bulletin of the Japan Institute of Metals
سال: 1986
ISSN: 0021-4426,1884-5835
DOI: 10.2320/materia1962.25.680